Xiaofei Wang; Bing Xing Wang; Wenhui Wu; Yili Hong.Reliability analysis for accelerated degradation data based on the Wiener process with random effects.Quality and Reliability Engineering InternationalVolume 36, Issue 6. 2020. PP 1969-1981
| 上一条： 没有了 |
| 下一条： 没有了 |
